Local atomic structure of zinc selenide films: EXAFS data

Journal of Structural Chemistry

Volumn 49, Issue SUPPL. 1, 2008, Pages

  Valeev, R G ^a,b   Deev, A N ^a   Gilmutdinov, F Z ^a   Bystrov, S G ^a   Pivovarova, O I ^a,b   Romanov, E A ^b   Kriventsov, V V ^c   Sharafutdinov, M R ^c   Eliseev, A A ^d  

^a PHYSICOTECHNICAL INSTITUTE   (Russian Federation)

^b UDMURT STATE UNIVERSITY   (Russian Federation)

^c BORESKOV INSTITUTE OF CATALYSIS   (Russian Federation)

^d MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

Atomic force microscopy; EXAFS spectroscopy; Fourier fitting; Local atomic structure; Nanocomposite; Semiconductor; X ray diffraction; ZnSe

Indexed keywords

EID: 62749155040     PISSN: 00224766     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10947-008-0210-5     Document Type: Article

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