Cycle time reduction in assembly and test manufacturing factories: A KPI driven methodology

2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008

Volumn , Issue , 2008, Pages 1234-1238

  Zheng, Li ^a   Xiao, Jing ^a   Hou, Forest ^b   Feng, Wei ^a   Li, Na ^a  

^a TSINGHUA UNIVERSITY   (China)

^b INTEL CORPORATION   (China)

Author keywords

Cycle time; Fifo rule; Key performance matrix; Value Stream Mapping

Indexed keywords

BENCHMARKING; INDUSTRIAL ENGINEERING;

COST SAVINGS; CYCLE TIME; CYCLE TIME PERFORMANCE; CYCLE TIME REDUCTIONS; DISPATCHING AUTOMATIONS; FACTORY PHYSICS; FIFO RULE; FIRST IN FIRST OUTS; IMPROVEMENT METHODS; KEY PERFORMANCE INDICATORS; KEY PERFORMANCE MATRIX; MATRIXES; QUEUING MODELS; RELEASE CONTROLS; TEST MANUFACTURING; TOOLS AND METHODS; VALUE STREAM MAPPING;

INDUSTRIAL PLANTS;

EID: 62749100645     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEEM.2008.4738067     Document Type: Conference Paper

References (6)

1. W. J. Hopp, M. L. Spearman, "Factory physics: foundations of manufacturing management", 2nd ed. Tsinghua press, 2002, pp. 248-282.
2. Joan Tafoya, "Direct observation for ATM", Intel 1st ATM Technical Event Conference, Nov., 2007
3. Forest Hou, Xiao Jing, "Effective implementation of cycle time reduction strategies for PDAT factory", Intel 1st ATM Technical Event Conference, Nov., 2007
4. Joan Tafoya, "Using math and science to realize significant cycle time improvement in ATM: applied factory physics", Intel Manufacturing Excellence Conference 2008
5. Forest Hou, "cycle time breakthroughs in PDAT factory to reach BIC performance", Intel Manufacturing Excellence Conference 2008
6. D. Delp, J. Si, J. W. Fowler, "The development of the complete X-factor contribution measurement for improving cycle time and cycle time variability", IEEE Trans. Semiconductor Manufacturing, vol.19, no. 3, 2006, pp. 352-362