An approach to high-throughput X-ray diffraction analysis of combinatorial polycrystalline thin film libraries

Journal of Applied Crystallography

Volumn 42, Issue 2, 2009, Pages 174-178

  Roncallo, S ^a   Karimi, O ^a   Rogers, K D ^a   Lane, D W ^a   Ansari, S A ^a  

^a CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

Combinatorial techniques; High throughput; Thin films; X ray diffraction

Indexed keywords

EID: 62649124742     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889809003227     Document Type: Article

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