Evidence for depth-dependent structural changes in freeze/thaw-cycled dry Nafion® using positron annihilation lifetime spectroscopy (PALS)

Journal of Membrane Science

Volumn 332, Issue 1-2, 2009, Pages 89-92

  McDonald, Robert C ^a   Gidley, David W ^b   Sanderson, Tracy ^b   Vallery, Richard S ^b  

^a Giner Incorporated and Giner Electrochemical Systems LLC   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Gamma rays; Permeability; Pore structure; Proton exchange membrane; Thermo mechanical effects

Indexed keywords

FREEZE/THAW; PERMEABILITY; PORE VOLUMES; POSITRON-ANNIHILATION LIFETIME SPECTROSCOPIES; PROTON-EXCHANGE MEMBRANE; RELATIVE INTENSITIES; STRUCTURAL CHANGES; STRUCTURAL STRESS; THERMO-MECHANICAL EFFECTS; VOID SIZES; VOID VOLUME FRACTIONS;

CAPILLARITY; ELECTROMAGNETIC WAVES; ELECTROMIGRATION; ELECTRONS; GAMMA RAYS; MEMBRANES; PORE STRUCTURE; POSITRON ANNIHILATION; POSITRON ANNIHILATION SPECTROSCOPY; PROTONS; STARS; THERMOMECHANICAL TREATMENT; VOID FRACTION; X RAY CAMERAS;

MECHANICAL PERMEABILITY;

ARTICLE; FREEZE THAWING; MEMBRANE STRUCTURE; POSITRON ANNIHILATION LIFETIME SPECTROSCOPY; PRIORITY JOURNAL; SPECTROSCOPY; STRUCTURE ANALYSIS; SURFACE PROPERTY; TEMPERATURE STRESS;

EID: 62649108308     PISSN: 03767388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.memsci.2009.01.043     Document Type: Article

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