Ultralow current measurements with silicon-on-sapphire integrator circuits

IEEE Electron Device Letters

Volumn 30, Issue 3, 2009, Pages 258-260

  Culurciello, Eugenio ^a   Montanaro, Hazael ^a   Kim, Dongsoo ^a  

^a Yale University   (United States)

Author keywords

Biomedical equipment; Biomedical measurements; Circuit noise

Indexed keywords

BIOMEDICAL EQUIPMENT; CORUNDUM; SAPPHIRE;

A/D CONVERTERS; BIOMEDICAL MEASUREMENTS; CIRCUIT NOISE; CURRENT MEASUREMENTS; INPUT CURRENTS; INTEGRATOR CIRCUITS; NOISE PERFORMANCE; RMS NOISE; SILICON ON SAPPHIRES; SUBPICOAMPERE CURRENTS;

ELECTRIC CURRENT MEASUREMENT;

EID: 62549147494     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2008.2010564     Document Type: Article

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