IPS and ToF-SIMS characterization of a Finemet surface: effect of heating

Surface and Interface Analysis

Volumn 41, Issue 3, 2009, Pages 231-237

  Chenakin, S P ^a   Galstyan, G G ^a   ToIstogouzow, A B ^b   Kruse, N ^c  

^a INSTITUTE OF METAL PHYSICS   (Ukraine)

^b UNIVERSITY OF FLORENCE   (Italy)

^c UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

Author keywords

Amorphous alloy; Annealing; Segregation; ToF SIMS; Valence band; XPS

Indexed keywords

AMORPHOUS ALLOYS; ATOMIC SPECTROSCOPY; ELECTRONIC STRUCTURE; HEAT TREATMENT; HEATING; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; IRON OXIDES; NIOBIUM; SEGREGATION (METALLOGRAPHY); SPECTRUM ANALYSIS; SURFACE RELAXATION; SURFACE STRUCTURE; SURFACE TREATMENT; VALENCE BANDS; X RAY PHOTOELECTRON SPECTROSCOPY;

AMORPHOUS STATE; AUGER SPECTRUM; COPPER ATOMS; ELEMENTAL IRONS; FINEMET; IN VACUUMS; PHYSICO-CHEMICAL STATE; QUENCHED STATE; ROOM TEMPERATURES; SEGREGATION; SELECTIVE REDUCTIONS; SURFACE COMPOSITIONS; THERMAL TREATMENTS; TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRIES; TOF-SIMS; VALENCE BAND STRUCTURES; XPS;

SECONDARY ION MASS SPECTROMETRY;

EID: 62549136620     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3012     Document Type: Article

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