Thickness dependence of surface plasmon polariton dispersion in transparent conducting oxide films at 1.55 μm

Optics Letters

Volumn 34, Issue 6, 2009, Pages 839-841

  Michelotti, F ^a   Dominici, L ^b   Descrovi, E ^c   Danz, N ^d   Menchini, F ^e  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

^b UNIVERSITY OF ROME TOR VERGATA   (Italy)

^c POLITECNICO DI TORINO   (Italy)

^d FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

^e ENEA C R CASACCIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE FILMS; DISPERSION (WAVES); ELECTROMAGNETIC WAVE POLARIZATION; ELECTRON RESONANCE; INTERFACES (MATERIALS); ITO GLASS; OPTICAL FILMS; PARTICLE OPTICS; PHONONS; PHOTONS; PLASMONS; QUANTUM THEORY; SURFACE PLASMON RESONANCE; TIN OXIDES;

ALUMINUM-DOPED ZINC OXIDE; INDIUM TIN OXIDE FILMS; PLASMA RESONANCE; RED-SHIFTED; SUPERMODES; SURFACE PLASMON POLARITONS; THICKNESS DEPENDENCE; TRANSPARENT CONDUCTING OXIDE FILMS;

OXIDE FILMS;

EID: 62549121576     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.34.000839     Document Type: Article

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