Temperature dependence of the thermal expansion of AlN

Applied Physics Letters

Volumn 94, Issue 10, 2009, Pages

  Figge, Stephan ^a   Kröncke, Hanno ^a   Hommel, Detlef ^a   Epelbaum, Boris M ^b  

^a UNIVERSITY OF BREMEN   (Germany)

^b UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; GALLIUM NITRIDE; SEMICONDUCTING GALLIUM; TEMPERATURE DISTRIBUTION; THERMAL STRESS; X RAY DIFFRACTION; ZINC SULFIDE;

ALGAN/GAN HETEROSTRUCTURES; ALN; ALN BULK CRYSTALS; ANISOTROPIC THERMAL EXPANSIONS; CHARACTERISTIC TEMPERATURES; DEBYE MODELS; EXPANSION COEFFICIENTS; HIGH RESOLUTION X-RAY DIFFRACTIONS; PHYSICAL VAPOR TRANSPORTS; TEMPERATURE DEPENDENCES; TEMPERATURE RANGES; THERMAL MISMATCHES; WURTZITE;

THERMAL EXPANSION;

EID: 62549115778     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3089568     Document Type: Article

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