Determination of the concentration profile of interfaces in multilayered nanostructures according to the angular dependence of X-ray photoelectron spectra: A new approach

Journal of Structural Chemistry

Volumn 49, Issue SUPPL. 1, 2008, Pages

  Babanov, Yu A ^a,b   Nemtsova, O M ^c   Reich, T ^d   Romashev, L N ^a   Milyaev, M A ^a   Ustinov, V V ^a  

^a INSTITUTE OF METAL PHYSICS   (Russian Federation)

^b UDMURT STATE UNIVERSITY   (Russian Federation)

^c PHYSICOTECHNICAL INSTITUTE   (Russian Federation)

^d JOHANNES GUTENBERG UNIVERSITY   (Germany)

Author keywords

Concentration profile; Interface; Multilayered nanostructures; XPS

Indexed keywords

EID: 62549087830     PISSN: 00224766     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10947-008-0214-1     Document Type: Article

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