Analysis of a quadratic algorithm for the angular-resolved XPS method for depth profiling

Journal of Electron Spectroscopy and Related Phenomena

Volumn 122, Issue 2, 2002, Pages 115-122

  Ignatova, V ^a,b   Stanchev, A ^a  

^a INSTITUTE OF ELECTRONICS   (Bulgaria)

^b UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

'Box car' function method; Angular resolved XPS analysis; Ion beam depth profiling

Indexed keywords

ALGORITHMS; ION BOMBARDMENT; MOLECULAR CRYSTALS; PROBLEM SOLVING; QUADRATIC PROGRAMMING; X RAY PHOTOELECTRON SPECTROSCOPY; ZIRCONIA;

ION BEAM DEPTH PROFILING;

INVERSE PROBLEMS;

EID: 0036467015     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(01)00348-6     Document Type: Article

References (9)

1. Application of particle and laser beams in materials technology