Measurements and modeling of planar metal film patterns deposited on dielectric substrates

IEEE Microwave and Wireless Components Letters

Volumn 19, Issue 3, 2009, Pages 134-136

  Krupka, Jerzy ^a   Gwarek, Wociech ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Dielectric resonator measurements; Finite difference time domain (FD TD) modeling; Metamaterials

Indexed keywords

DIELECTRIC RESONATORS; ELECTRODEPOSITION; FINITE DIFFERENCE TIME DOMAIN METHOD; METALLIC FILMS; METAMATERIALS; MICROWAVE DEVICES; RESONANCE;

DIELECTRIC SUBSTRATES; FINITE DIFFERENCE TIME DOMAIN ANALYSIS; FINITE-DIFFERENCE TIME-DOMAIN (FD-TD) MODELING; IN PLANES; LOW LOSS; METAL FILMS; METAMATERIAL; OUT OF PLANES; PLANAR METALS; Q FACTORS; RESONANCE FREQUENCY SHIFTS; SPLIT POST DIELECTRIC RESONATORS; SURFACE RESISTIVITIES; TE011 MODES; TOTAL LOSS;

METALS;

EID: 62449281868     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2009.2013678     Document Type: Article

References (9)

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