Investigation of Fe/Al interface as a function of annealing temperature using XPS

Applied Surface Science

Volumn 255, Issue 12, 2009, Pages 6149-6154

  Brajpuriya, R ^a   Shripathi, T ^a  

^a UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

Author keywords

Fe Al; Phase evolution; Soft magnetic multilayers; XPS

Indexed keywords

ANNEALING; BINARY ALLOYS; BINDING ENERGY; CHARGE TRANSFER; CHEMICAL BONDS; ELECTRONIC PROPERTIES; IRON ALLOYS; MAGNETIC MULTILAYERS; X RAY PHOTOELECTRON SPECTROSCOPY;

ANNEALING TEMPERATURES; BINDING ENERGY POSITIONS; ELECTRONIC INFORMATION; MULTILAYER STRUCTURES; PHASE EVOLUTIONS; SOFT MAGNETIC MULTILAYERS; ULTRAHIGH VACUUM CONDITIONS; VALENCE BAND SPECTRA;

ALUMINUM ALLOYS;

EID: 62349116949     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.01.070     Document Type: Article

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