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Volumn 255, Issue 12, 2009, Pages 6149-6154
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Investigation of Fe/Al interface as a function of annealing temperature using XPS
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Author keywords
Fe Al; Phase evolution; Soft magnetic multilayers; XPS
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Indexed keywords
ANNEALING;
BINARY ALLOYS;
BINDING ENERGY;
CHARGE TRANSFER;
CHEMICAL BONDS;
ELECTRONIC PROPERTIES;
IRON ALLOYS;
MAGNETIC MULTILAYERS;
X RAY PHOTOELECTRON SPECTROSCOPY;
ANNEALING TEMPERATURES;
BINDING ENERGY POSITIONS;
ELECTRONIC INFORMATION;
MULTILAYER STRUCTURES;
PHASE EVOLUTIONS;
SOFT MAGNETIC MULTILAYERS;
ULTRAHIGH VACUUM CONDITIONS;
VALENCE BAND SPECTRA;
ALUMINUM ALLOYS;
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EID: 62349116949
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2009.01.070 Document Type: Article |
Times cited : (60)
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References (36)
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