Effect of rough interface on the thermoelectric figure of merit of the Bi2Te3/PbTe superlattice

Wuli Xuebao/Acta Physica Sinica

Volumn 58, Issue 2, 2009, Pages 1212-1218

  Mu, Wu Di ^a   Cheng, Hai Feng ^a   Chen, Zhao Hui ^a   Tang, Geng Ping ^a   Wu, Zhi Qiao ^a  

^a NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

Author keywords

Figure of merit; Rough interface; Superlattice

Indexed keywords

EID: 62249093135     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (13)

1. Hicks L D, Dresselhaus M S 1993 Phys. Rev. B 47 12727
2. Hicks L D, Dresselhaus M S 1993 Phys. Rev. B 47 16631
3. Venkatasubramaman R, Colpitts T, Watko E 1997 J. Cryst. Growth 170 817
4. Liu E K, Zhu B S, Luo J S 2003 Semiconductor Physics (Beijing: National Defence Industry Press) p370 (in Chinese)
5. 3-based Materials (Ph. D. Dissertation) (Shanghai: Silicate Graduate School) (in Chinese)
6. Broido D A, Reinecke T L 1995 Phys. Rev. B 51 13797
7. Lin-Chung P J, Reinecke T L 1995 Phys. Rev. B 51 13244
8. Zeng J Y 2007 Quantum Mechanics (Beijing: Science Press) p74 (in Chinese)
9. Liu E K, Zhu B S, Luo J S 2003 Semiconductor Physics (Beijing: National Defence Industry Press) p100 (in Chinese)
10. Gong J, Liang X X, Ban S L 2005 Chin. Phys. B 14 201
11. Liu W L 2004 In-plane Thermoelectric Properties of Si/Ge Superlattices (Ph. D. Dissertation) (Los Angeles: University of California)
12. Xue Z Q, Wu Q D, Li J 1991 Physics of Thin Films (Beijing: Electronic Industry Press) p279 (in Chinese)
13. Dong Z C 2001 Acta Phys. Sin. 50 1779(in Chinese)