Scaling of reduced fidelity susceptibility in the one-dimensional transverse-field XY model

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 373, Issue 16, 2009, Pages 1444-1448

  You, Wen Long ^a,b   Lu, Wen Long ^b  

^a PEKING UNIVERSITY   (China)

^b CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

One dimensional transverse field XY model; Quantum phase transition; Reduced fidelity susceptibility; Scaling behavior

Indexed keywords

PHASE TRANSITIONS;

LOGARITHMIC DIVERGENCE; QUANTUM CRITICAL POINTS; QUANTUM PHASE TRANSITIONS; SCALING BEHAVIOR; TRANSVERSE FIELD;

QUANTUM THEORY;

EID: 62149126281     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physleta.2009.02.046     Document Type: Article

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