Fidelity susceptibility, scaling, and universality in quantum critical phenomena

Physical Review B - Condensed Matter and Materials Physics

Volumn 77, Issue 24, 2008, Pages

  Gu, Shi Jian ^a   Kwok, Ho Man ^a   Ning, Wen Qiang ^a,b   Lin, Hai Qing ^a  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b FUDAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 45249110391     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.77.245109     Document Type: Article

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