The role of native and photoinduced defects in the multi-pulse subpicosecond damage behavior of oxide films

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7132, Issue , 2008, Pages 713209-

  Mero, Mark ^a   Emmert, Luke A ^a   Rudolph, Wolfgang ^a  

^a UNIVERSITY OF NEW MEXICO   (United States)

Author keywords

Defects; Incubation; Modeling; Oxides; Subpicosecond dielectric breakdown

Indexed keywords

ABSORPTION CROSS SECTIONS; AVALANCHE IONIZATIONS; BREAKDOWN BEHAVIORS; CONDUCTION BAND ELECTRONS; DAMAGE BEHAVIORS; DAMAGE THRESHOLDS; DEEP TRAPS; EXPERIMENTAL DATUM; FLUENCE; INCUBATION; INITIAL POPULATIONS; LASER-INDUCED; MODELING; MULTI PULSE; OXIDE MATERIALS; OXIDE THIN FILMS; PHOTO-INDUCED DEFECTS; PULSE NUMBERS; RATE EQUATIONS; SUBPICOSECOND DIELECTRIC BREAKDOWN; TRAP LEVELS; TRAP STATE; TRAPPING STATE; WIDE BAND GAP MATERIALS;

DEFECTS; ELECTRIC BREAKDOWN; ELECTRIC CONDUCTIVITY; ELECTRON MOBILITY; ENERGY GAP; IONIZATION OF LIQUIDS; LASER DAMAGE; LASERS; OPTICAL MATERIALS; PHOTOMASKS; POPULATION STATISTICS; PULSED LASER APPLICATIONS;

OXIDE FILMS;

EID: 62149111466     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.804430     Document Type: Conference Paper

References (9)

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9. 2 optical coatings with tunable index and their response to intense subpicosecond laser pulse irradiation," in preparation.