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Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7132, Issue , 2008, Pages

Presentation and comparison of damage test procedures for fused silica and KDP crystals

(8) Lamaignere L a Donval, T a Loiseau, M a Bouillet, S a Courchinoux, R a Poncetta, J C a Bertussi, Bertrand b Bercegol, H a

a CEA CESTA (France)

b CEA LE RIPAULT (France)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM SHAPES; BULK DAMAGES; DAMAGE DENSITIES; DAMAGE PROBABILITIES; DAMAGE TESTS; DATA ANALYSIS; DATA TREATMENTS; DEFECTS DISTRIBUTIONS; ERROR BARS; FLUENCE RANGES; FLUENCES; GOOD CORRELATIONS; KDP CRYSTALS; KEY PARAMETERS; LARGE APERTURES; LASER CHARACTERISTICS; LASER DAMAGE RESISTANCES; LOW DAMAGES; POLARISATION; PULSE DURATIONS; REPRODUCIBILITY; SINGLE SHOTS; SMALL AREAS; SMALL SAMPLES; SPATIAL DISTRIBUTIONS; SPECTRAL MODULATIONS; TEST PROCEDURES; TESTING PROCEDURES; TOP HATS; UV FUSED SILICAS;

CRYSTALS; GAUSSIAN BEAMS; LASER DAMAGE; LASERS; OPTICAL MATERIALS; PULSE GENERATORS; PULSED LASER APPLICATIONS; SILICA; TESTING;

FUSED SILICA;

EID: 62149098442 PISSN: 0277786X EISSN: None Source Type: Conference Proceeding
DOI: 10.1117/12.804471 Document Type: Conference Paper

Times cited : (2)

References (7)

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2
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- «
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3
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4
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6
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