Ultrahigh spontaneous emission extraction efficiency induced by evanescent wave coupling

Applied Physics Letters

Volumn 94, Issue 9, 2009, Pages

  Wang, X L ^a   Furue, S ^a   Ogura, M ^a   Voliotis, V ^b,c   Ravaro, M ^b   Enderlin, A ^b   Grousson, R ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b INSTITUT DES NANOSCIENCES DE PARIS   (France)

^c UNIVERSITÉ D EVRY VAL D ESSONNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; REFRACTIVE INDEX; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR QUANTUM WELLS; SPONTANEOUS EMISSION; SUBSTRATES;

EVANESCENT WAVES; EXTRACTION EFFICIENCIES; FLAT SUBSTRATES; GAAS/ALGAAS; QUANTUM-WELL STRUCTURES; SUB WAVELENGTHS; TOTAL INTERNAL REFLECTIONS;

EXTRACTION;

EID: 62149091733     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3086887     Document Type: Article

References (17)

1. E. F. Schubert, Light-Emitting Diodes (Cambridge University Press, Cambridge, 2007), Chap..
2. H. Benisty, H. D. Neve, and C. Weisbuch, IEEE J. Quantum Electron. 0018-9197 10.1109/3.709578 34, 1612 (1998).
3. M. Born and E. Wolf, Principles of Optics (Cambridge University Press, Cambridge, 1999), Chap..
4. F. Fornel, Evanescent Waves From Newtonian Optics to Atomic Optics (Springer, Berlin, 2001).
5. D. W. Pohl, W. Denk, and M. Lanz, Appl. Phys. Lett. 0003-6951 10.1063/1.94865 44, 651 (1984).
6. E. Betzig and R. J. Chichester, Science 0036-8075 10.1126/science.262. 5138.1422 262, 1422 (1993).
7. M. Ohtsu, J. Lightwave Technol. 0733-8724 10.1109/50.400696 13, 1200 (1995).
8. X. -L. Wang and V. Voliotis, J. Appl. Phys. 0021-8979 10.1063/1.2212056 99, 121301 (2006).
9. E. Kapon, D. M. Hwang, and R. Bhat, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.63.430 63, 430 (1989).
10. X. -L. Wang, M. Ogura, and H. Matsuhata, Appl. Phys. Lett. 0003-6951 10.1063/1.115340 67, 3629 (1995).
11. X. -Q. Liu, X. -L. Wang, and M. Ogura, Appl. Phys. Lett. 0003-6951 10.1063/1.1403235 79, 1622 (2001).
12. D. E. Aspnes, S. M. Kelso, R. A. Logan, and R. Bhat, J. Appl. Phys. 0021-8979 10.1063/1.337426 60, 754 (1986).
13. S. R. Kisting, P. W. Bohn, E. Andideh, I. Adesida, B. T. Cunningham, G. E. Stillman, and T. D. Harris, Appl. Phys. Lett. 0003-6951 10.1063/1.103473 57, 1328 (1990).
14. R. K. Chang and A. J. Campillo, Optical Processes in Microcavities (World Scientific, Singapore, 1996).
15. D. Kleppner, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.47.233 47, 233 (1981).
16. E. Yablonovitch, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.58.2059 58, 2059 (1987).
17. Similar results were also obtained for a point from an electric dipole oriented along the V-groove axis direction, but in that case the intensities of the side emission lobes are slightly stronger than the case of in-plane orientation.