A high-speed area detector for novel imaging techniques in a scanning transmission electron microscope

Ultramicroscopy

Volumn 109, Issue 4, 2009, Pages 304-311

  Caswell, T A ^a   Ercius, P ^a   Tate, M W ^a   Ercan, A ^a   Gruner, S M ^a   Muller, D A ^a  

^a Cornell University   (United States)

Author keywords

(STEM); Copper; Crystal grain differentiation; Diffraction imaging; Pixel array detector (PAD); Scanning transmission electron microscope

Indexed keywords

(STEM); CRYSTAL GRAIN DIFFERENTIATION; DIFFRACTION IMAGING; PIXEL ARRAY DETECTOR (PAD); SCANNING TRANSMISSION ELECTRON MICROSCOPE;

CHARGE COUPLED DEVICES; CRYSTALLINE MATERIALS; DETECTORS; DIFFRACTION; ELECTRON BEAMS; ELECTRON TUBES; ELECTRONS; HOLOGRAPHIC INTERFEROMETRY; PHOTOMULTIPLIERS; PIXELS; SCANNING; SEMICONDUCTOR QUANTUM WIRES; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON MICROSCOPES;

EID: 61849149968     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.11.023     Document Type: Article

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