|
Volumn 9, Issue 4, 2009, Pages 717-721
|
Titanium oxide thin layers deposed by dip-coating method: Their optical and structural properties
|
Author keywords
Optical properties; SEM; Thin film; Titanium oxide
|
Indexed keywords
CERAMIC CAPACITORS;
DIELECTRIC WAVEGUIDES;
GELATION;
OPTICAL CONSTANTS;
PERMITTIVITY;
REFRACTIVE INDEX;
SCANNING ELECTRON MICROSCOPY;
SOL-GEL PROCESS;
THIN FILM DEVICES;
THIN FILMS;
TITANIUM;
TITANIUM OXIDES;
X RAY DIFFRACTION ANALYSIS;
BAND GAPS;
DEPOSITED FILMS;
DIELECTRIC CONSTANTS;
DIP-COATING METHODS;
DISPERSION DATUM;
DISPERSION PARAMETERS;
HIGH-FREQUENCY DIELECTRICS;
OPTICAL NONLINEAR SUSCEPTIBILITIES;
SEM;
SINGLE OSCILLATORS;
SOL-GEL METHODS;
SPECTRAL DATUM;
STRUCTURAL INVESTIGATIONS;
THIN LAYERS;
THIRD ORDERS;
TRANSMISSION SPECTRUMS;
WEMPLE-DIDOMENICO MODELS;
X-RAY DIFFRACTIONS;
OPTICAL MICROSCOPY;
|
EID: 61849147878
PISSN: 15671739
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cap.2008.07.001 Document Type: Article |
Times cited : (28)
|
References (15)
|