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Single-crystal X-ray diffraction data were collected at 100 K using a STOE imaging-plate diffraction system (IPSD-2) with graphite-monochromatized Mo Kα radiation. A numerical absorption correction was applied using the X-RED program set. Direct methods and full-matrix least-squares refinements against F2 were performed with SHEIXΓL package. Crystal data for, In(en)3][In5Te9(en) 2].0.5en}n(1, Hexagonal P61, Z=6, a, b, 11.6147(2) A, c, 51.9135(15) Å, γ, 120°, V, 6064.9(2) Å3, 2θmax (Mo Kα, 46.58°, Dcalcd, 3.512 g/cm3, μ, 9.750 mm -3, total reflections, 3777, unique reflections [F ο2 > 2σ (Fο 2, 3399, parameters, 217, GOF, 1.169, R1, 7.72% and wR2, 17.35% for I > 2σI, Bec
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EDS analysis: the calculated ratio for In and Te is 2:3 and the result from EDS is 39.65:60.28.
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