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Volumn 60, Issue 10, 2009, Pages 890-892
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A microcompression study of shape-memory deformation in U-13 at.% Nb
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Author keywords
Electron backscattering diffraction (EBSD); Microcompression testing; Shape memory alloys (SMAs); Transmission electron microscopy (TEM)
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Indexed keywords
BACKSCATTERING;
ELECTRON DIFFRACTION;
ELECTRON MICROSCOPES;
ELECTRON SCATTERING;
ELECTRONS;
ION BEAMS;
NIOBIUM;
SHAPE MEMORY EFFECT;
TRANSMISSION ELECTRON MICROSCOPY;
CRYSTALLOGRAPHIC ORIENTATIONS;
DIAMOND TIPS;
ELECTRON BACKSCATTERING DIFFRACTION (EBSD);
FOCUSED ION BEAM TECHNIQUES;
MICROCOMPRESSION TESTING;
NANO-INDENTATION INSTRUMENTS;
POLY-CRYSTALLINE;
SHAPE MEMORIES;
SHAPE MEMORY ALLOYS (SMAS);
SHAPE-MEMORY EFFECTS;
STRESS-STRAIN BEHAVIORS;
ALLOYS;
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EID: 61749098193
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/j.scriptamat.2009.02.003 Document Type: Article |
Times cited : (20)
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References (15)
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