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Volumn 60, Issue 10, 2009, Pages 890-892

A microcompression study of shape-memory deformation in U-13 at.% Nb

Author keywords

Electron backscattering diffraction (EBSD); Microcompression testing; Shape memory alloys (SMAs); Transmission electron microscopy (TEM)

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; ELECTRON MICROSCOPES; ELECTRON SCATTERING; ELECTRONS; ION BEAMS; NIOBIUM; SHAPE MEMORY EFFECT; TRANSMISSION ELECTRON MICROSCOPY;

EID: 61749098193     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2009.02.003     Document Type: Article
Times cited : (20)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.