Spatial morphology of interfacial voids and other features generated at coarse silica particles in nickel during cold rolling and annealing

Scripta Materialia

Volumn 60, Issue 10, 2009, Pages 862-865

  Xu, W ^a   Ferry, M ^a   Humphreys, F J ^b  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Deformation microstructure; Electron backscattering diffraction (EBSD); Recrystallization; Voids

Indexed keywords

BACKSCATTERING; DEFORMATION; ELECTRON DIFFRACTION; ELECTRON SCATTERING; MICROSTRUCTURE; NICKEL ALLOYS; RECRYSTALLIZATION (METALLURGY); SILICA; THREE DIMENSIONAL;

DEFORMATION MICROSTRUCTURE; ELECTRON BACK-SCATTER DIFFRACTIONS; ELECTRON BACKSCATTERING DIFFRACTION (EBSD); HIGH RESOLUTIONS; INTERFACIAL VOIDS; NUCLEATION SITES; PARTICLE DEFORMATIONS; RECRYSTALLIZATION; SILICA PARTICLES; TRUE STRAINS; VOIDS;

COLD ROLLING;

EID: 61749096723     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2009.01.034     Document Type: Article

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