Structural investigations of ITO-ZnO films grown by the combinatorial pulsed laser deposition technique

Applied Surface Science

Volumn 255, Issue 10, 2009, Pages 5288-5291

  Craciun, Doina ^a   Socol, Gabriel ^a   Stefan, Nicolaie ^a   Miroiu, Marimona ^a   Mihailescu, Ion N ^a   Galca, Aurelian Catalin ^b   Craciun, Valentin ^a,c  

^a NATIONAL INSTITUTE FOR LASER   (Romania)

^b NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^c J Crayton Pruitt Family Department of Biomedical Engineering   (United States)

Author keywords

Combinatorial; ITO; Pulsed laser deposition; TCO; ZnO

Indexed keywords

ENERGY DISPERSIVE SPECTROSCOPY; II-VI SEMICONDUCTORS; PULSED LASER DEPOSITION; SPECTROSCOPIC ELLIPSOMETRY; ZINC; ZINC OXIDE;

COMBINATORIAL; CONDUCTIVE OXIDES; CRYSTALLINE STRUCTURE; ENERGY DISPERSIVE X RAY SPECTROSCOPY; MAXIMUM THICKNESS; PULSED-LASER DEPOSITION TECHNIQUE; STRUCTURAL INVESTIGATION; X RAY REFLECTIVITY;

PULSED LASERS;

EID: 61749093075     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.07.120     Document Type: Article

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