Nanostructural characterizations of hydrogen-permselective Si-Co-O membranes by transmission electron microscopy

Journal of Materials Research

Volumn 24, Issue 2, 2009, Pages 372-378

  Fujisaki, Shinji ^a,b,c   Hataya, Koji ^a,d   Saito, Tomohiro ^a   Arai, Shigeo ^c   Iwamoto, Yuji ^a,d   Kuroda, Kotaro ^c  

^a JAPAN FINE CERAMICS CENTER   (Japan)

^b NGK INSULATORS LTD   (Japan)

^c NAGOYA UNIVERSITY   (Japan)

^d NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; COBALT; COBALT COMPOUNDS; ELECTRON DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPES; ELECTRON TUBES; ELECTRONS; ENERGY DISSIPATION; GAS PERMEABLE MEMBRANES; HOLOGRAPHIC INTERFEROMETRY; HYDROGEN; LIQUID METALS; PERMEATION; PERMSELECTIVE MEMBRANES; SCANNING ELECTRON MICROSCOPY; SILICA; SILICON; SOLUTIONS;

AMORPHOUS SI; AMORPHOUS SILICAS; ANODIC ALUMINAS; CO-DOPED; COBALT OXIDES; CROSS-SECTIONAL SCANNING; ELECTRON ENERGY LOSS; ELEMENTAL MAPPINGS; HIGH TEMPERATURES; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPIES; HIGHLY DENSE; HYDROGEN GAS; IN-SITU; MESOPORE; MESOPOROUS; METAL-ORGANIC PRECURSORS; NANOSTRUCTURAL; OXIDATION STATE; SELECTED-AREA ELECTRON DIFFRACTION PATTERNS; SELECTIVE PERMEATIONS; SIZE RANGES;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 61749089333     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2009.0038     Document Type: Article

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