Terahertz emission from tubular Pb(Zr, Ti)O3 nanostructures

Nano Letters

Volumn 8, Issue 12, 2008, Pages 4404-4409

  Scott, J F ^a   Fan, H J ^a,g   Kawasaki, S ^a,h   Banys, J ^b   Ivanov, M ^b   Krotkus, A ^c   Macutkevic, J ^c   Blinc, R ^d   Laguta, V V ^e   Cevc, P ^d   Liu, J S ^f   Kholkin, A L ^f  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b VILNIUS UNIVERSITY   (Lithuania)

^c CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

^d JO EF STEFAN INSTITUTE   (Slovenia)

^e INSTITUTE OF PHYSICS   (Czech Republic)

^f UNIVERSITY OF AVEIRO   (Portugal)

^g NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^h 33 Tanakamiya cho Takeda F   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; INDIUM ARSENIDE; LEAD; NANOSTRUCTURES; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; SEMICONDUCTING LEAD COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICES; ZINC COMPOUNDS; ZIRCONIUM;

CONCENTRATION GRADIENTS; DEMBER EFFECTS; FERROELECTRIC SWITCHING; FREQUENCY SPECTRUMS; HIGHER FREQUENCIES; INAS; LEAD ZIRCONATE TITANATES; NANO-SCALE GEOMETRIES; NANO-STRUCTURED; OPTICAL RECTIFICATIONS; OPTICALLY PUMPED; ORDER OF MAGNITUDES; PB(ZR ,TI)O; PZT; PZT FILMS; SI SUBSTRATES; SURFACE ACCUMULATIONS; TERAHERTZ DEVICES; TERAHERTZ EMISSIONS; TERAHERTZ RADIATIONS; WALL THICKNESS;

EMISSION SPECTROSCOPY;

EID: 61649119639     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl802277k     Document Type: Article

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