Structure, magnetic properties and magnetostriction of Fe81Ga19 thin films

Journal of Magnetism and Magnetic Materials

Volumn 320, Issue 5, 2008, Pages 769-773

  Wang, B W ^a,b   Li, S Y ^a   Zhou, Y ^a   Huang, W M ^a   Cao, S Y ^a  

^a HEBEI UNIVERSITY OF TECHNOLOGY   (China)

^b INTERNATIONAL CENTRE FOR MATERIALS PHYSICS   (China)

Author keywords

Fe Ga thin film; Magnetic property; Magnetostriction; Structure

Indexed keywords

ANNEALING; GALLIUM; GRAIN SIZE AND SHAPE; MAGNETIC DOMAINS; MAGNETIC FIELDS; MAGNETIC MATERIALS; MAGNETOSTRICTION; MAGNETOSTRICTIVE DEVICES; SCANNING ELECTRON MICROSCOPY; STRUCTURAL PROPERTIES; THIN FILM DEVICES; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION ANALYSIS;

ANNEALING TEMPERATURES; APPLIED MAGNETIC FIELDS; CAPACITIVE CANTILEVERS; COERCIVITY; FE-GA THIN FILM; GRAIN SIZES; IN PLANES; INDUCED ANISOTROPIES; PREFERENTIAL ORIENTATIONS; REMANENCE RATIOS; SCANNING ELECTRON MICROSCOPES; STRUCTURE; VIBRATING SAMPLE MAGNETOMETERS;

MAGNETIC ANISOTROPY;

EID: 61649085946     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2007.08.022     Document Type: Article

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