Compositional dependence of the open volume of GeSx glasses studied by positron annihilation spectroscopy

Optoelectronics and Advanced Materials, Rapid Communications

Volumn 2, Issue 2, 2008, Pages 63-66

  Wang, Bing ^a   Tao, Haizheng ^b   Lin, Changgui ^b   Wang, Zhu ^a   Zeng, Jianmin ^c   Li, Hui ^a   Zhao, Xiujian ^b  

^a WUHAN UNIVERSITY   (China)

^b WUHAN UNIVERSITY OF TECHNOLOGY   (China)

^c Guangxi Key Laboratory for the Advance Materials and New Preparation Technology   (China)

Author keywords

Chalcogenide glasses; Doppler broadening; Positron annihilation lifetime

Indexed keywords

BOND LENGTH; DOPPLER EFFECT; ELECTRONS; GERMANIUM COMPOUNDS; GLASS; POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS; THULIUM;

CHALCOGENIDE GLASS; COMPOSITIONAL DEPENDENCE; DOPPLER BROADENING MEASUREMENTS; MEAN LIFETIME; POSITRON ANNIHILATION LIFETIMES; POSITRON LIFETIME; POSITRON TRAPPING; STRUCTURAL ORDERING;

SULFUR COMPOUNDS;

EID: 61449197069     PISSN: 18426573     EISSN: 20653824     Source Type: Journal    
DOI: None     Document Type: Article

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