Nanostructural pulse laser-deposited Ag(Tl)SbS semiconductor thin films: Growth dynamics, structural and electrical properties

Applied Surface Science

Volumn 255, Issue 10, 2009, Pages 5256-5259

  Panchenko, L ^a   Khlyap, H ^b   Laptev, V ^b  

^a SUMY STATE UNIVERSITY   (Ukraine)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

Ag containing thin films; Optical information storage; Pulse laser deposition; XRD

Indexed keywords

AMORPHOUS FILMS; DEPOSITION; DIGITAL STORAGE; SEMICONDUCTING ANTIMONY COMPOUNDS; SEMICONDUCTING SILVER COMPOUNDS; SEMICONDUCTOR GROWTH; SEMICONDUCTOR LASERS; SILVER COMPOUNDS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION;

DATA STORAGE APPLICATIONS; OPTICAL INFORMATION; PULSE LASER DEPOSITION; PULSE REPETITION FREQUENCIES; SEMICONDUCTOR THIN FILMS; STRUCTURAL AND ELECTRICAL PROPERTIES; SUBSTRATE TEMPERATURE; TIME-DEPENDENT CHANGES;

SULFUR COMPOUNDS;

EID: 61349184465     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.07.128     Document Type: Article

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