Synchrotron infrared reflectivity measurements of iron at high pressures

Applied Optics

Volumn 48, Issue 3, 2009, Pages 545-552

  Seagle, Christopher T ^a   Heinz, Dion L ^a,b   Liu, Zhenxian ^c   Hemley, Russell J ^c  

^a UNIVERSITY OF CHICAGO   (United States)

^b UNIVERSITY OF CHICAGO   (United States)

^c GEOPHYSICAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE EMISSION; HIGH PRESSURE ENGINEERING; IRON; SYNCHROTRON RADIATION; SYNCHROTRONS; TEMPERATURE MEASUREMENT;

EMPIRICAL FUNCTIONS; HEXAGONAL CLOSE PACKED; INFRARED REFLECTANCE; INFRARED REFLECTIVITY MEASUREMENT; KRAMERS-KRONIG ANALYSIS; PRESSURE DEPENDENCE; REFLECTANCE SPECTRUM; WAVELENGTH DEPENDENCE;

REFLECTION;

EID: 61349108783     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.48.000545     Document Type: Article

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