Chromatic aberration measurement for transmission interferometric testing

Applied Optics

Volumn 47, Issue 35, 2008, Pages 6508-6511

  Seong, Kibyung ^a   Greivenkamp, John E ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETERS; RAY TRACING; WAVE TRANSMISSION; WAVEFRONTS;

CHROMATIC ABERRATION; INTERFEROMETRIC TESTING; REVERSE RAY TRACING; TRANSMITTED WAVEFRONTS; WAVE-FRONT RADII;

ABERRATIONS;

EID: 60949106510     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.006508     Document Type: Article

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