On the chromatic aberration of microlenses

Optics Express

Volumn 14, Issue 11, 2006, Pages 4687-4694

  Ruffieux, Patrick ^a   Scharf, Toralf ^a   Herzig, Hans Peter ^a   Völke, Reinhard ^b   Weible, Kenneth J ^b  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^b SUSS MICROOPTICS SA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIFFRACTION GRATINGS; ELECTROMAGNETIC WAVE PROPAGATION; OPTICAL PROPERTIES; OPTICAL SENSORS; REFRACTIVE INDEX;

ACHROMATIC MICROLENSES; DIFFRACTION PATTERN; FRESNEL NUMBER;

OPTICAL INSTRUMENT LENSES;

EID: 33744541648     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.14.004687     Document Type: Article

References (7)

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4. W. Wang, A. T. Friberg, E. Wolf, "Structure of focused fields in systems with large Fresnel numbers," J. Opt. Soc. Am. A. 12, 1947 (1995).
5. J. Arnaud, "Representation of Gaussian beams by complex rays," Appl. Opt. 24, (1985).
6. U. Vokinger, R. Dändliker, P. Blattner, and H. P. Herzig, "Unconventional treatment of focal shift," Opt. Commun. 157, 218-224 (1998).
7. nd ed., (MacGraw-Hill, New York, 1968), Chap. 4, pp. 63-69.