Identification of three regimes of behavior for cell attachment on topographically patterned substrates

Langmuir

Volumn 25, Issue 1, 2009, Pages 367-376

  Stevenson, Peter M ^a   Donald, Athene M ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CELL ATTACHMENTS; CRITICAL ANGLES; CRITICAL LENGTHS; DIFFERENT MODES; HEIGHT RIDGES; INCIDENT ANGLES; PATTERNED SUBSTRATES; POLY(DIMETHYLSILOXANE); SINGLE CELLS;

CELL CULTURE;

ANIMAL; ARTICLE; CELL ADHESION; CELL STRAIN 3T3; MOUSE; SCANNING ELECTRON MICROSCOPY;

3T3 CELLS; ANIMALS; CELL ADHESION; MICE; MICROSCOPY, ELECTRON, SCANNING;

EID: 60849138812     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la802859v     Document Type: Article

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