Near-edge X-ray absorption fine-Structure, X-ray photoemission, and Fourier transform infrared spectroscopies of ultrananocrystalline diamond/hydrogenated amorphous carbon composite films

Japanese Journal of Applied Physics

Volumn 48, Issue 2, 2009, Pages

  Yoshitake, Tsuyoshi ^a   Nagano, Akira ^a   Ohmagari, Shinya ^a   Itakura, Masaru ^a   Kuwano, Noriyuki ^a   Ohtani, Ryota ^b   Setoyama, Hiroyuki ^b   Kobayashi, Eiichi ^b   Nagayama, Kunihito ^a  

^a KYUSHU UNIVERSITY   (Japan)

^b Kyushu Synchrotron Light Research Center   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ABSORPTION SPECTROSCOPY; AMORPHOUS CARBON; AMORPHOUS FILMS; CARBON FILMS; COMPOSITE FILMS; CRYSTALLITES; DANGLING BONDS; DIAMOND FILMS; EMISSION SPECTROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GRAIN BOUNDARIES; HYDROGEN; HYDROGEN BONDS; NANOCRYSTALLINE MATERIALS; PHOTOEMISSION; PULSED LASER DEPOSITION; SPECTROSCOPIC ANALYSIS; X RAY ABSORPTION;

CHEMICAL BONDING STRUCTURES; FOURIER TRANSFORM INFRA-RED SPECTROSCOPIES; FT-IR SPECTRUM; HYDROGEN ATOMS; HYDROGENATED AMORPHOUS CARBON (A C:H); NEAR-EDGE X-RAY ABSORPTIONS; PHOTOEMISSION SPECTRUM; PULSED LASERS; ULTRA-NANO-CRYSTALLINE DIAMONDS; X-RAY PHOTOEMISSIONS;

FOURIER TRANSFORMS;

EID: 60849107743     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.48.020222     Document Type: Article

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