Microstructure evolution in pure Al processed with twist extrusion

Materials Transactions

Volumn 50, Issue 1, 2009, Pages 96-100

  Orlov, Dmitry ^a   Beygelzimer, Yan ^b   Synkov, Sergey ^b   Varyukhin, Viktor ^b   Tsuji, Nobuhiro ^a   Horita, Zenji ^c  

^a OSAKA UNIVERSITY   (Japan)

^b DONETSK PHYSICOTECHNICAL INSTITUTE   (Ukraine)

^c KYUSHU UNIVERSITY   (Japan)

Author keywords

Aluminum; Electron backscattered diffraction (EBSD); Optical microscopy; Severe plastic deformation; Twist extrusion

Indexed keywords

ALUMINA; ALUMINUM; ELECTRON DIFFRACTION; EXTRUSION; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; OPTICAL DATA STORAGE; OPTICAL INSTRUMENTS; OPTICAL MICROSCOPY; PLASTIC DEFORMATION; PLASTICS;

AVERAGE GRAIN SIZES; CROSS SECTIONS; ELECTRON BACK-SCATTER DIFFRACTIONS; ELECTRON BACKSCATTERED DIFFRACTION (EBSD); HIGH ANGLE BOUNDARIES; HIGH PURITIES; LONGITUDINAL AXIS; LOW ANGLE GRAIN BOUNDARIES; MATERIAL FLOWS; MICROSTRUCTURE EVOLUTIONS; ONE PASS; ROOM TEMPERATURES; SEVERE PLASTIC DEFORMATION; SUB-GRAIN STRUCTURES; TWIST EXTRUSION;

INTEGRATED OPTOELECTRONICS;

EID: 60849092539     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.MD200802     Document Type: Conference Paper

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