Analysis of key technologies for virtual instruments metrology

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7130, Issue , 2008, Pages

  Liu, Guixiong ^a   Xu, Qingui ^a   Gao, Furong ^b   Guan, Qiuju ^a   Fang, Qiang ^b  

^a SOUTH CHINA UNIVERSITY OF TECHNOLOGY   (China)

^b Guangdong Institute of Metrology   (China)

Author keywords

Automatic metrological tool; Measurement uncertainty; Metrological validation; Security assess; Software testing; Virtual instruments

Indexed keywords

BENCHMARKING; COMPUTER SOFTWARE SELECTION AND EVALUATION; COMPUTER TESTING; DIGITAL INSTRUMENTS; INSTRUMENT TESTING; MECHANICAL VARIABLES MEASUREMENT; SOFTWARE ENGINEERING; SOFTWARE RELIABILITY; TECHNOLOGY; UNCERTAINTY ANALYSIS;

AUTOMATIC METROLOGICAL TOOL; MEASUREMENT UNCERTAINTY; METROLOGICAL VALIDATION; SECURITY ASSESS; VIRTUAL INSTRUMENTS;

SOFTWARE TESTING;

EID: 60649117842     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.819751     Document Type: Conference Paper

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