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Volumn , Issue , 2001, Pages 161-164

Metrological Automatic Support in intelligent measurement systems

Author keywords

Measurements; Metrological Automatic Support; Virtual instrumentation

Indexed keywords

DATA ACQUISITION; MEASUREMENTS;

EID: 60649119980     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IDAACS.2001.942003     Document Type: Conference Paper
Times cited : (1)

References (8)
  • 1
    • 0030106275 scopus 로고    scopus 로고
    • Metrological automatic support of measurement results in intelligent measurement systems
    • Vladimir Sobolev, Olli Aumala, Metrological automatic support of measurement results in intelligent measurement systems // Measurement. - 1996.-Vol. 17. - No. 3. - Pp. 151-159.
    • (1996) Measurement , vol.17 , Issue.3 , pp. 151-159
    • Sobolev, V.1    Aumala, O.2
  • 3
    • 0006035738 scopus 로고    scopus 로고
    • The new data acquisition technology on the basis of virtual instrumentation
    • Tampere 1-6, June Finnish Scociety of Automation, Helsinki, 1997
    • Vladimir Sobolev, The new data acquisition technology on the basis of virtual instrumentation // Proceedings of the XIV IMEKO World Congress, Tampere 1-6, June 1997. - Finnish Scociety of Automation, Helsinki, 1997. - Vol. V. - pp. 12-17.
    • (1997) Proceedings of the XIV IMEKO World Congress , vol.5 , pp. 12-17
    • Sobolev, V.1
  • 4
    • 0006036244 scopus 로고    scopus 로고
    • Virtual instruments for accurate data acquisition of noisy signals
    • Smolenice. Castle, Slovak Republic
    • O. Aumala, "Virtual Instruments for Accurate Data Acquisition of Noisy Signals", Proc. of IMEKO Int. Workshop on ADC Model., Smolenice. Castle, Slovak Republic, 1996, pp 79-84.
    • (1996) Proc. of IMEKO Int. Workshop on ADC Model. , pp. 79-84
    • Aumala, O.1
  • 5
    • 0033359549 scopus 로고    scopus 로고
    • An error correction technique for scan conversion-based transient digitizers
    • P. Arpaia, F. Cennamo, P. Daponte, "An error correction technique for scan conversion-based transient digitizers", IEEE Trans, on Instrum. and Meas., Vol. 48, no. 4, 1999, pp. 785-792.
    • (1999) IEEE Trans, on Instrum. and Meas. , vol.48 , Issue.4 , pp. 785-792
    • Arpaia, P.1    Cennamo, F.2    Daponte, P.3
  • 8
    • 0038791781 scopus 로고    scopus 로고
    • Metrological automatic support in intelligent measurement systems
    • Tampere, 1-6 June 1997. - Finnish Scociety of Automation, Helsinki
    • Vladimir Sobolev, Eric Tsvetkov, Metrological automatic support in intelligent measurement systems // Proceedings of the XIV IMEKO World Congress, Tampere, 1-6 June 1997. - Finnish Scociety of Automation, Helsinki, 1997. - Vol. V. - pp. 139-144.
    • (1997) Proceedings of the XIV IMEKO World Congress , vol.5 , pp. 139-144
    • Sobolev, V.1    Tsvetkov, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.