In situ pressure measurements in dimpled elastohydrodynamic sliding contacts by Raman microspectroscopy

Tribology International

Volumn 42, Issue 5, 2009, Pages 724-730

  Yagi, Kazuyuki ^a,b   Vergne, Philippe ^b   Nakahara, Tsunamitsu ^c  

^a KYUSHU UNIVERSITY   (Japan)

^b UNIVERSITÉ DE LYON   (France)

^c TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Dimple; Elastohydrodynamic; Pressure; Raman microspectroscopy; Rheology; Temperature

Indexed keywords

ELASTOHYDRODYNAMICS; FILM THICKNESS; GLASS; PRESSURE; RHEOLOGY; TEMPERATURE;

DIMPLE; FILM THICKNESS DISTRIBUTION; HIGH-PRESSURE VISCOSITY; OCCURRENCE CONDITIONS; OPTICAL INTERFEROMETRY; RAMAN MICROSPECTROSCOPY; RHEOLOGICAL RESPONSE; SLIDE-TO-ROLL RATIO;

PRESSURE MEASUREMENT;

EID: 60649107305     PISSN: 0301679X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.triboint.2008.10.005     Document Type: Article

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