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Volumn , Issue , 2008, Pages 171-174

Thermal-aware electrical analysis of high-speed interconnect

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL ANALYSIS; ELECTRICAL PERFORMANCE; EQUIVALENT THERMALS; FINITE-DIFFERENCE METHODS; HIGH-SPEED-INTERCONNECT; NUMERICAL EXAMPLES; ON-CHIP INTERCONNECT; SIGNAL-INTEGRITY ANALYSIS; SPICE SIMULATORS; SUBSTRATE TEMPERATURES; TEMPERATURE PROFILES; THERMAL MODELING;

EID: 60649086030     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EDAPS.2008.4736027     Document Type: Conference Paper
Times cited : (2)

References (8)
  • 1
    • 84937650904 scopus 로고
    • Electromigration: A brief survey and some recent results
    • J. R. Black, "Electromigration: A brief survey and some recent results," IEEE Trans. Electron Devices, vol. 16, pp. 338-347, 1969.
    • (1969) IEEE Trans. Electron Devices , vol.16 , pp. 338-347
    • Black, J.R.1
  • 3
    • 20444496778 scopus 로고    scopus 로고
    • Modeling and analysis of nonuniform substrate temperature effects on global ULSI interconnects
    • A. H. Ajami, K. Banerjee, and M. Pedram, "Modeling and analysis of nonuniform substrate temperature effects on global ULSI interconnects," IEEE Trans. Comput.-Aided Design Integr. Circuits Syst., vol. 24, pp. 849-861, 2005.
    • (2005) IEEE Trans. Comput.-Aided Design Integr. Circuits Syst , vol.24 , pp. 849-861
    • Ajami, A.H.1    Banerjee, K.2    Pedram, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.