Picosecond reflectance recovery dynamics of porous silicon multilayer

Journal of the Optical Society of America B: Optical Physics

Volumn 26, Issue 2, 2009, Pages 249-253

  Beresna, Martynas ^a   Tomašiunas, Roland ^a   Volk, János ^b   Kádár, György ^b  

^a VILNIUS UNIVERSITY   (Lithuania)

^b RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; DYNAMICS; REFLECTION; REFRACTIVE INDEX; TRANSFER MATRIX METHOD;

EXCITATION ENERGY DENSITY; MULTI-LAYERED STRUCTURE; NON-CONDUCTIVE MATERIALS; NONLINEAR CHARACTERS; POROUS SILICON MULTILAYERS; PUMP-PROBE TECHNIQUE; REFLECTANCE RECOVERY; REFLECTANCE SPECTRUM;

POROUS SILICON;

EID: 60549117328     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.26.000249     Document Type: Article

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