Rietveld analysis of nano-crystalline MnFe2O4 with electron powder diffraction

Bulletin of the Korean Chemical Society

Volumn 30, Issue 1, 2009, Pages 183-187

  Kim, Jin Gyu ^a   Seo, Jung wook ^b   Cheon, Jinwoo ^c   Kim, Youn Joong ^a  

^a Korea Basic Science Institute (KBSI)   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^c Yonsei University   (South Korea)

Author keywords

Electron powder diffraction; Energy filtering; Image plate; Nano crystalline MnFe2O4; Rietveld analysis

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; ELECTRON DIFFRACTION; ELECTRONS; PLATES (STRUCTURAL COMPONENTS); RIETVELD ANALYSIS; RIETVELD REFINEMENT; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLOGRAPHIC DATA; ELECTRON POWDER DIFFRACTION; ENERGY FILTERING; IMAGE PLATES; NANO-CRYSTALLINE MNFE; REFINEMENT TECHNIQUES; SELECTED AREA ELECTRON DIFFRACTION; STRUCTURE REFINEMENTS;

NANOCRYSTALLINE POWDERS;

EID: 60149088632     PISSN: 02532964     EISSN: 12295949     Source Type: Journal    
DOI: 10.5012/bkcs.2009.30.1.183     Document Type: Article

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