Energy transfer among rare earth ions induced by annealing process of Tm‒Er codoped aluminum oxide thin films

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 373, Issue 8-9, 2009, Pages 890-893

  Xiao, Zhisong ^a   Zhou, Bo ^a   Xu, Fei ^b   Zhu, Fang ^a   Yan, Lu ^a   Zhang, Feng ^a   Huang, Anping ^a  

^a BEIHANG UNIVERSITY   (China)

^b SHANGHAI UNIVERSITY   (China)

Author keywords

Annealing; Cross relaxation; Energy transfer; Er; Photoluminescence; Tm

Indexed keywords

ALUMINA; ALUMINUM COATINGS; ANNEALING; ENERGY TRANSFER; ERBIUM; ERBIUM COMPOUNDS; METAL IONS; OXIDE FILMS; PHOTOLUMINESCENCE; PULSED LASER DEPOSITION; RARE EARTHS; THIN FILMS; THULIUM; THULIUM COMPOUNDS;

ALUMINUM OXIDE THIN FILMS; AMORPHOUS ALUMINUM OXIDE; ANNEALING PROCESS; ANNEALING TEMPERATURES; CROSS RELAXATION; ENERGY TRANSFER PROCESS; INFRARED EMISSIONS; RARE EARTH IONS;

ALUMINUM OXIDE;

EID: 59349108559     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physleta.2009.01.005     Document Type: Article

References (34)

1. Smulovich J. Proc. of SPIE 2996 (1997) 143
2. Polman A. J. Appl. Phys. 82 (1997) 1
3. In: Coffa S., and Tsybeskov L. (Eds). MRS Bulletin. Silicon Based Optoelectronics vol. 23 (1998) 16
4. Kani J., and Jinno M. Electron. Lett. 35 (1999) 1004
5. Seo S.Y., Shin J.H., Bae B.S., Park N., Penninkhof J.J., and Polman A. Appl. Phys. Lett. 82 (2003) 3445
6. Chen D., Wang Y., Bao F., and Yu Y. J. Appl. Phys. 101 (2007) 113511
7. Xiao Z., Serna R., Afonso C.N., and Vickridge I. Appl. Phys. Lett. 87 (2005) 111103
8. Toudert J., Nune-Sanchez S., de Castro M.J., and Serna R. Appl. Phys. Lett. 92 (2008) 121111
9. Yamauchi H., Murugan G.S., and Ohishi Y. J. Appl. Phys. 97 (2005) 043505
10. Chillcce E.F., Rodrigues E., Neves A.A.R., Moreira W.C., Cesar C.L., and Barbosa L.C. Opt. Fiber Technol. 12 (2006) 185
11. de Souza A.B., de Araujo M.T., Vermelho M.V.D., Cassanjes F.C., Ribeiro S.J.L., and Massaddeq Y. J. Non-Cryst. Solids 353 (2007) 94
12. Huang L., Jha A., Shen S., and Liu X. Opt. Express. 12 (2004) 2429
13. Seo S.Y., and Shin J.H. Appl. Phys. Lett. 85 (2004) 4151
14. Shen S., Jha A., Zhang E., and Wilson S. C. R. Chimie 5 (2002) 921
15. Jeong H., Oha K., Han S.R., and Morse T. Chem. Phys. Lett. 367 (2003) 507
16. van den Hoven G.N., Snoks E., Polman A., van Uffelen J.W.M., Oei Y.S., and Smit M.K. Appl. Phys. Lett. 62 (1993) 3065
17. Aitken B.G., Dejneka M.J., and Powley M.L. J. Non-Cryst. Solids 349 (2004) 115
18. Lee M.B., Lee J.H., Frederick B.G., and Richardson N.V. Surf. Sci. 448 (2000) L207
19. Villars P., and Calvert L.D. Pearson's Handbook of Crystallographic Data for Intermetallic Phase (1986), American Society for Metals, Metals Park, OH pp. 1047, 2177, and references therein
20. Zhou B., Xiao Z., Huang A., Yan L., Zhu F., Wang J., Yin P., and Wang H. Prog. Natural Sci. 18 (2008) 661
21. Lahoz F., Almenara J.M., Rodrigues-Mendoza U.R., Martin I.R., and Lavin V. J. Appl. Phys. 99 (2006) 053103
22. Lincoln J.R., Brocklesby W.S., Cusso F., Townsend J.E., Ropper A.C.T., and Pearson A. J. Lumin. 50 (1991) 297
23. Watanabe K., Tamaoka H., Fujii M., and Hayashi S. J. Appl. Phys. 92 (2002) 4001
24. Lin H., Wang X.Y., Li C.M., Yang H.X., Pun E.Y.B., and Tanabe S. J. Lumin. 128 (2008) 74
25. Xiao Z., Serna R., and Afonso C.N. Opt. Lett. 33 (2008) 608
26. Serna R., de Castro M.J., Chaos J.A., and Afonso C.N. Appl. Phys. Lett. 75 (1999) 4073
27. Dexter D.L. J. Chem. Phys. 21 (1953) 836
28. Jander P., and Brocklesby W.S. IEEE J. Quantum Electron. 40 (2004) 509
29. Jeong H., Oh K., Han S.R., and Morse T.F. Opt. Lett. 28 (2003) 161
30. Xiao Z., Serna R., Afonso C.N., and Vickridge I. J. Appl. Phys. 101 (2007) 033112
31. Balda R., Fernande J., Arriandiaga M.A., Lacha L.M., and Fernadez-Navarro J.M. Opt. Mater. 28 (2006) 1253
32. Sennaroglu A., Kurt A., and Ozen G. J. Phys. Condens. Mater. 16 (2004) 2471
33. Oliveira S.L., Lima S.M., Catunda T., Nunes L.A.O., Rohiling J.H., Bento A.C., and Baeso M.L. Appl. Phys. Lett. 84 (2004) 359
34. Serna R., de Castro M.J., Chaos J.A., Suarez-Garcia A., Afonso C.N., Fernandez M., and Vickridge I. J. Appl. Phys. 90 (1999) 5120