메뉴 건너뛰기




Volumn 470, Issue 1-2, 2009, Pages 27-34

Combinatorial material science studies of Fe-rich Fe-Al and Fe-Si thin films

Author keywords

Combinatorial materials science; Fe alloys; M ssbauer effect spectroscopy; X ray diffraction

Indexed keywords

ALLOYS; ALUMINUM; CHEMICAL ANALYSIS; DIFFRACTION; GALLIUM; LIBRARIES; MATERIALS SCIENCE; METALLIC COMPOUNDS; MOLYBDENUM; MOLYBDENUM ALLOYS; PROBABILITY DENSITY FUNCTION; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SILICON ALLOYS; STRUCTURE (COMPOSITION); THIN FILMS; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

EID: 59249095786     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.02.066     Document Type: Article
Times cited : (7)

References (32)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.