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Volumn 470, Issue 1-2, 2009, Pages 27-34
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Combinatorial material science studies of Fe-rich Fe-Al and Fe-Si thin films
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Author keywords
Combinatorial materials science; Fe alloys; M ssbauer effect spectroscopy; X ray diffraction
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Indexed keywords
ALLOYS;
ALUMINUM;
CHEMICAL ANALYSIS;
DIFFRACTION;
GALLIUM;
LIBRARIES;
MATERIALS SCIENCE;
METALLIC COMPOUNDS;
MOLYBDENUM;
MOLYBDENUM ALLOYS;
PROBABILITY DENSITY FUNCTION;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON;
SILICON ALLOYS;
STRUCTURE (COMPOSITION);
THIN FILMS;
X RAY ANALYSIS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
ATOMIC ORDERS;
BCC STRUCTURES;
COMBINATORIAL MATERIAL SCIENCE;
COMBINATORIAL MATERIALS SCIENCE;
ELECTRON MICRO PROBES;
FE-ALLOYS;
FIELD DISTRIBUTIONS;
HYPERFINE FIELD DISTRIBUTIONS;
LOCAL STRUCTURES;
MEAN HYPERFINE FIELDS;
ROOM TEMPERATURES;
SI CONTENTS;
SSBAUER SPECTROSCOPIES;
TWO COMPONENTS;
X-RAY STUDIES;
IRON ALLOYS;
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EID: 59249095786
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2008.02.066 Document Type: Article |
Times cited : (7)
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References (32)
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