Young-type interferences using single-electron sources and an atomic-size two-center interferometer: Dependence with interferometer parameters

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 267, Issue 2, 2009, Pages 206-210

  Fremont F ^a   Suarez, S ^b   Barrachina, R O ^c   Hajaji, A ^a   Sisourat, N ^c   Dubois, A ^c   Chesnel, J Y ^a  

^a UNIVERSITÉ DE CAEN   (France)

^b CENTRO ATÓMICO BARILOCHE   (Argentina)

^c SORBONNE UNIVERSITÉ   (France)

Author keywords

Auger effect; Double slit; Interferences; Single electron source

Indexed keywords

ANGULAR DISTRIBUTION; ATOMS; AUGERS; ELECTRON SOURCES; ELEMENTARY PARTICLE SOURCES; HELIUM; INTERFEROMETERS; INTERFEROMETRY; IONIZATION; MOTION ESTIMATION; OPTICAL INSTRUMENTS; PROTONS;

AUGER EFFECT; DOUBLE SLIT; DOUBLE-SLIT EXPERIMENTS; ELECTRON WAVELENGTHS; INTERFERENCE PATTERNS; INTERFERENCES; SINGLE-ELECTRON SOURCE; TYPE INTERFERENCES;

ELECTRONS;

EID: 58849150250     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.10.012     Document Type: Article

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