Single- and double-electron capture cross sections for slow He2+ impact on O2, H2, and D2

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 75, Issue 4, 2007, Pages

  Da Silva, S Figueira ^a   Winter, Hp ^a   Aumayr, F ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRAPS; ION BEAMS; OPTICAL PUMPING;

ELECTRON CAPTURE; GAS CHAMBER; IMPACT ENERGIES; SLOW PRODUCT IONS;

ATOMIC PHYSICS;

EID: 34247121964     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.75.042706     Document Type: Article

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