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Volumn 3202, Issue , 1998, Pages 197-208
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Adhesive forces acting on micro objects in manipulation under SEM
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Author keywords
Adhesive force; Electrostatic force; Force measurement; Micro object handling; SEM
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTROSTATIC DEVICES;
ELECTROSTATIC FORCE;
ELECTROSTATICS;
INTERFEROMETERS;
MICROSYSTEMS;
NANOCANTILEVERS;
PROGRAMMING THEORY;
SCANNING ELECTRON MICROSCOPY;
SPECTROSCOPIC ANALYSIS;
SURFACE TENSION;
VAN DER WAALS FORCES;
ADHESIVE FORCE;
CANTILEVER TIPS;
DIRECT MEASUREMENTS;
IN-SITU;
LASER INTERFEROMETERS;
MEASUREMENT SYSTEMS;
MICRO FORCES;
MICRO OBJECT HANDLING;
SCANNING ELECTRON MICROSCOPES;
SEM;
SPRING CONSTANTS;
SURFACE TENSION FORCES;
FORCE MEASUREMENT;
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EID: 58849088456
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.298038 Document Type: Conference Paper |
Times cited : (8)
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References (8)
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