Assessing device reliability based on scheduled discrete degradation measurements

Probabilistic Engineering Mechanics

Volumn 24, Issue 2, 2009, Pages 151-158

  Hsieh, Min Hsiung ^a   Jeng, Shuen Lin ^b   Shen, Pao Sheng ^a  

^a TUNGHAI UNIVERSITY   (Taiwan)

^b NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Discrete degradation; First passage time; Goodness of fit; Interval ratio; Nonhomogeneous compound Poisson process; Reliability; Scheduled inspection

Indexed keywords

AIRCRAFT; AUTOMOBILE PARTS AND EQUIPMENT; AUTOMOBILE SHOCK ABSORBERS; DEGRADATION; ELECTRON TRANSITIONS; GROWTH (MATERIALS); PARAMETER ESTIMATION; POISSON DISTRIBUTION; POISSON EQUATION; POISSON RATIO; RELIABILITY;

DISCRETE DEGRADATION; FIRST PASSAGE TIME; GOODNESS-OF-FIT; INTERVAL RATIO; NONHOMOGENEOUS COMPOUND POISSON PROCESS; SCHEDULED INSPECTION;

INSPECTION;

EID: 58549117685     PISSN: 02668920     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.probengmech.2008.04.003     Document Type: Article

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