A geometric-process maintenance model for a deteriorating system under a random environment

IEEE Transactions on Reliability

Volumn 52, Issue 1, 2003, Pages 83-89

  Lam, Yeh ^a,b   Zhang, Yuan Lin ^c,d  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b NE University at Quinhuangado ^*  (China)

^c SANJIANG UNIVERSITY   (China)

^d SOUTHEAST UNIVERSITY   (China)

Author keywords

Compound Poisson process; Geometric process; Random shocks; Renewal process; Replacement policy

Indexed keywords

COSTS; ELECTRIC MACHINERY; PROBABILITY DISTRIBUTIONS; RANDOM PROCESSES;

COMPOUND POISSON PROCESS;

STATISTICAL METHODS;

EID: 0037333694     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2002.807243     Document Type: Article

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