SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 40, Issue 13, 2008, Pages 1764-1767

Characterization of atomic-level plasmonic structures by low-energy EELS

(1) Nagao, Tadaaki a

a NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

Atom chains; Low energy EELS; One dimension; Plasmon

Indexed keywords

ATOMIC PHYSICS; ATOMIC SPECTROSCOPY; ATOMS; CRYSTAL ATOMIC STRUCTURE; DISPERSIONS; ELECTRON BEAMS; PLASMONS;

ATOM CHAINS; BRAGG BEAMS; CHAIN STRUCTURES; LOW-ENERGY EELS; MOMENTUM RESOLUTIONS; ONE-DIMENSION; PLASMON; PLASMON DISPERSION; SCATTERING SPECTROSCOPY; SILICON (0 0 1) SURFACES;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 58449116401 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.3002 Document Type: Article

Times cited : (8)

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