Structural characterization of thin Ni films deposited on (001) ZnSe

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 15, Issue 2, 1997, Pages 247-251

  Ruvimov, Sergei ^a,c   Liliental Weber, Zuzanna ^a   Bourret, Edith D ^a   Swider, Wendy ^a   Washburn, Jack ^a   Duxstad, Kristin J ^a,b   Haller, E E ^a,b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b Lawrence Berkeley National Laboratory   (United States)

^c IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5844363162     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589273     Document Type: Article

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